Abstract
In computer vision, machine learning extracts image information, and semantic segmentation labels each pixel to localize industrial defects. Training requires expert-annotated masks, while foundation models promise label-efficient transfer. Across nine domains, zero-shot use, domain-specific models at nested label budgets, and one jointly trained model tested how that promise translates into practice. A frozen foundation encoder with a trained head and low-rank adaptation were compared with fully fine-tuned convolutional models using Defect-IoU, which measures predicted–annotated defect overlap. Zero-shot use detected no defect pixels, while additional labels yielded domain-dependent Validation gains. In the capped specialist–joint comparison, joint training increased the eight-domain Test mean for both foundation-model adaptations but reduced it for convolutional models. Separately, the best fully fine-tuned convolutional specialist achieved 49.1% Validation Defect-IoU on proprietary Injection Molding with 45 labeled training images. Under the evaluated conditions, pretraining did not guarantee superior segmentation; outcomes depended on adaptation and domain-specific supervision.

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Copyright (c) 2026 Christof Weickhardt, Gregor Hammer, Susanne Suter, Moritz Kirschmann
